book-chapter · 2018
An Outline of a Complementary Inspection System for Micro-Electro-Mechanical System (MEMS) Devices Based on Radiography and Plenoptic Camera
In the last decades, micro manufacturing was driven by micro-electro-mechanical systems (MEMS), where well-established manufacturing methods based on semicon...
1 citationsDOI: https://doi.org/10.3233/978-1-61499-902-7-33