review · 2005
Characterization of polymer thin films by phase‐sensitive acoustic microscopy and atomic force microscopy: a comparative review
The potential of phase-sensitive acoustic microscopy (PSAM) for characterizing polymer thin films is reviewed in comparison to atomic force microscopy (AFM)....
17 citationsDOI: https://doi.org/10.1111/j.1365-2818.2005.01484.xOpen accessPDF reported by metadata