The Impact of X-Ray and Proton Irradiation on ${\rm HfO}_2/{\rm Hf}$-Based Bipolar Resistive Memories

Jinshun Bi, Zhengzhi Han, En Xia Zhang, Michael W. McCurdy, Robert A. Reed, Ronald D. Schrimpf, Daniel M. Fleetwood, Michael L. Alles

This paper investigates total-ionizing dose effects on the electrical characteristics of HfO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink=...