article · 2005
A Study Of Charge Control In n- And p-type Lattice Matched And Strained Channel MODFETs With GaAs And InP Substrates
A general charge control model has been developed to understand the performance of n-type and p-type MODFETs with strained active channels. The effects of st...
6 citationsDOI: https://doi.org/10.1109/cornel.1987.721215