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article · 2005

A Study Of Charge Control In n- And p-type Lattice Matched And Strained Channel MODFETs With GaAs And InP Substrates

A general charge control model has been developed to understand the performance of n-type and p-type MODFETs with strained active channels. The effects of st...

6 citationsDOI: https://doi.org/10.1109/cornel.1987.721215
A Study Of Charge Control In n- And p-type Lattice Matched And Strained Channel MODFETs With GaAs And InP Substrates