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article · 2003

Study of the influence of process parameters on gate oxide degradation during contact etching in MERIE and HDP reactors

Two designs of experiments (DOE) have been carried out, in a magnetically enhanced reactive ion etching (MERIE) reactor and in a high-density plasma (HDP) re...

0 citationsDOI: https://doi.org/10.1109/ppid.1999.798797
Study of the influence of process parameters on gate oxide degradation during contact etching in MERIE and HDP reactors