article · 2003
Study of the influence of process parameters on gate oxide degradation during contact etching in MERIE and HDP reactors
Two designs of experiments (DOE) have been carried out, in a magnetically enhanced reactive ion etching (MERIE) reactor and in a high-density plasma (HDP) re...
0 citationsDOI: https://doi.org/10.1109/ppid.1999.798797