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article · 2015

Topographic characterization of unworn contact lenses assessed by atomic force microscopy and wavelet transform

This paper analyses the three-dimensional (3-D) surface morphology of optic surface of unworn contact lenses (CLs) using atomic force microscopy (AFM) and wa...

9 citationsDOI: https://doi.org/10.1002/jemt.22580
Topographic characterization of unworn contact lenses assessed by atomic force microscopy and wavelet transform