preprint · 2010
Contactless measurement of electrical conductance of a thin film of amorphous germanium
We present a contactless method for measuring charge in a thin film of amorphous germanium (a-Ge) with a nanoscale silicon MOSFET charge sensor. This method ...
0 citationsDOI: https://doi.org/10.48550/arxiv.1010.0045Open accessPDF reported by metadata