{"associated_institutions":[{"country_code":"DE","display_name":"Fraunhofer Institute for Telecommunications, Heinrich Hertz Institute","id":"https://openalex.org/I2800274787","relationship":"child","ror":"https://ror.org/02tbr6331","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Open Communication Systems","id":"https://openalex.org/I2800804238","relationship":"child","ror":"https://ror.org/00px80p03","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for High-Speed Dynamics, Ernst-Mach-Institut","id":"https://openalex.org/I2801198184","relationship":"child","ror":"https://ror.org/00csq2k70","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Manufacturing Engineering and Automation","id":"https://openalex.org/I3018473509","relationship":"child","ror":"https://ror.org/01rvqha10","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Industrial Mathematics","id":"https://openalex.org/I3019415892","relationship":"child","ror":"https://ror.org/019hjw009","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Computer Graphics Research","id":"https://openalex.org/I3019423309","relationship":"child","ror":"https://ror.org/04gmsar03","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Industrial Engineering","id":"https://openalex.org/I3020504353","relationship":"child","ror":"https://ror.org/01nh64743","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Microengineering and Microsystems","id":"https://openalex.org/I3133415080","relationship":"child","ror":"https://ror.org/00bkxry42","type":"facility"},{"country_code":"CL","display_name":"Fraunhofer Chile Research Foundation","id":"https://openalex.org/I4210086090","relationship":"child","ror":"https://ror.org/00h0my365","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Physical Measurement Techniques","id":"https://openalex.org/I4210088263","relationship":"child","ror":"https://ror.org/004n2nr09","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Applied Solid State Physics","id":"https://openalex.org/I4210090068","relationship":"child","ror":"https://ror.org/0083ncs46","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for High Frequency Physics and Radar Techniques","id":"https://openalex.org/I4210090867","relationship":"child","ror":"https://ror.org/00a6rw165","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Structural Durability and System Reliability","id":"https://openalex.org/I4210093342","relationship":"child","ror":"https://ror.org/00gt16g40","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Mechatronic Systems Design","id":"https://openalex.org/I4210093498","relationship":"child","ror":"https://ror.org/004nttc42","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Environmental, Safety and Energy Technology UMSICHT","id":"https://openalex.org/I4210094097","relationship":"child","ror":"https://ror.org/00nj8ry09","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Production Technology IPT","id":"https://openalex.org/I4210096398","relationship":"child","ror":"https://ror.org/00t0rcy29","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Material Flow and Logistics","id":"https://openalex.org/I4210098062","relationship":"child","ror":"https://ror.org/00z7dje19","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Algorithms and Scientific Computing","id":"https://openalex.org/I4210098248","relationship":"child","ror":"https://ror.org/00trw9c49","type":"facility"},{"country_code":"SG","display_name":"Fraunhofer Singapore","id":"https://openalex.org/I4210098302","relationship":"child","ror":"https://ror.org/00yqed873","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Research Institution for Energy Infrastructures and Geotechnologies IEG","id":"https://openalex.org/I4210098353","relationship":"child","ror":"https://ror.org/00y718461","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Experimental Software Engineering","id":"https://openalex.org/I4210098380","relationship":"child","ror":"https://ror.org/00r1wdc11","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Wood Research Wilhelm-Klauditz-Institut","id":"https://openalex.org/I4210098631","relationship":"child","ror":"https://ror.org/015cbgt79","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Group for Microelectronics","id":"https://openalex.org/I4210100084","relationship":"child","ror":"https://ror.org/0128qg670","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Microelectronic Circuits and Systems","id":"https://openalex.org/I4210100127","relationship":"child","ror":"https://ror.org/01243c877","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Interfacial Engineering and Biotechnology","id":"https://openalex.org/I4210100731","relationship":"child","ror":"https://ror.org/0131dra29","type":"facility"},{"country_code":"IT","display_name":"Fraunhofer Italia Research","id":"https://openalex.org/I4210104565","relationship":"child","ror":"https://ror.org/015hz7767","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Institute for Translational Medicine and Pharmacology","id":"https://openalex.org/I4210107844","relationship":"child","ror":"https://ror.org/01s1h3j07","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer ICT Group","id":"https://openalex.org/I4210109692","relationship":"child","ror":"https://ror.org/01kjych06","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Institute for Photonic Microsystems","id":"https://openalex.org/I4210110247","relationship":"child","ror":"https://ror.org/020n3fw10","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Applied Information Technology","id":"https://openalex.org/I4210110507","relationship":"child","ror":"https://ror.org/01ak24c12","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Transportation and Infrastructure Systems","id":"https://openalex.org/I4210111151","relationship":"child","ror":"https://ror.org/01nqmht92","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","id":"https://openalex.org/I4210111500","relationship":"child","ror":"https://ror.org/01zx97922","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Toxicology and Experimental Medicine","id":"https://openalex.org/I4210111966","relationship":"child","ror":"https://ror.org/02byjcr11","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Information Center for Planning and Building","id":"https://openalex.org/I4210113222","relationship":"child","ror":"https://ror.org/01yrp7892","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Silicon Technology","id":"https://openalex.org/I4210113487","relationship":"child","ror":"https://ror.org/024p6aq98","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Applied Optics and Precision Engineering","id":"https://openalex.org/I4210115660","relationship":"child","ror":"https://ror.org/02afjh072","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Process Engineering and Packaging","id":"https://openalex.org/I4210115674","relationship":"child","ror":"https://ror.org/02at7zv53","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Solar Energy Systems","id":"https://openalex.org/I4210117272","relationship":"child","ror":"https://ror.org/02kfzvh91","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Technological Trend Analysis","id":"https://openalex.org/I4210119566","relationship":"child","ror":"https://ror.org/02sm4kj57","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Electronic Nano Systems","id":"https://openalex.org/I4210120526","relationship":"child","ror":"https://ror.org/02h12bg79","type":"facility"},{"country_code":"GB","display_name":"Fraunhofer UK Research","id":"https://openalex.org/I4210120565","relationship":"child","ror":"https://ror.org/02dfg5n73","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Institute for Large Structures in Production Engineering IGP","id":"https://openalex.org/I4210122911","relationship":"child","ror":"https://ror.org/03tevfg71","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Wind Energy Systems","id":"https://openalex.org/I4210124112","relationship":"child","ror":"https://ror.org/02phevt59","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Integrated Circuits","id":"https://openalex.org/I4210124274","relationship":"child","ror":"https://ror.org/024ape423","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Machine Tools and Forming Technology","id":"https://openalex.org/I4210124503","relationship":"child","ror":"https://ror.org/026taa863","type":"facility"},{"country_code":"AT","display_name":"Fraunhofer Austria","id":"https://openalex.org/I4210125165","relationship":"child","ror":"https://ror.org/038bzrc91","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Institute for Cognitive Systems","id":"https://openalex.org/I4210127444","relationship":"child","ror":"https://ror.org/02fez3815","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Applied Polymer Research","id":"https://openalex.org/I4210128116","relationship":"child","ror":"https://ror.org/02yhs7m71","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies","id":"https://openalex.org/I4210128143","relationship":"child","ror":"https://ror.org/02hm5m482","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Research Institution for Individualized and Cell-Based Medical Engineering","id":"https://openalex.org/I4210130518","relationship":"child","ror":"https://ror.org/039c0bt50","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Institute for Systems and Innovation Research","id":"https://openalex.org/I4210131336","relationship":"child","ror":"https://ror.org/03vyq6t71","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Laser Technology","id":"https://openalex.org/I4210132567","relationship":"child","ror":"https://ror.org/03ebbfh95","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Mechanics of Materials","id":"https://openalex.org/I4210132651","relationship":"child","ror":"https://ror.org/04hm8eb66","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Secure Information Technology","id":"https://openalex.org/I4210133470","relationship":"child","ror":"https://ror.org/03qt2gs44","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Reliability and Microintegration","id":"https://openalex.org/I4210134425","relationship":"child","ror":"https://ror.org/031aqk326","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Molecular Biology and Applied Ecology","id":"https://openalex.org/I4210134473","relationship":"child","ror":"https://ror.org/03j85fc72","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Manufacturing Technology and Advanced Materials","id":"https://openalex.org/I4210134580","relationship":"child","ror":"https://ror.org/03pwyy961","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Nondestructive Testing","id":"https://openalex.org/I4210134618","relationship":"child","ror":"https://ror.org/03wq67h32","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Applied and Integrated Security","id":"https://openalex.org/I4210136922","relationship":"child","ror":"https://ror.org/03w0bbr97","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Digital Medicine","id":"https://openalex.org/I4210137873","relationship":"child","ror":"https://ror.org/04farme71","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Digital Media Technology","id":"https://openalex.org/I4210138578","relationship":"child","ror":"https://ror.org/04gp0yb49","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Factory Operation and Automation","id":"https://openalex.org/I4210139350","relationship":"child","ror":"https://ror.org/04qfaak15","type":"facility"},{"country_code":"SE","display_name":"Fraunhofer Chalmers Research Centre for Industrial Mathematics","id":"https://openalex.org/I4210139723","relationship":"child","ror":"https://ror.org/03tqh5n18","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Project Centre Wolfsburg","id":"https://openalex.org/I4210141254","relationship":"child","ror":"https://ror.org/03jgt3n70","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology","id":"https://openalex.org/I4210142562","relationship":"child","ror":"https://ror.org/03vvewn46","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Chemical Technology","id":"https://openalex.org/I4210144047","relationship":"child","ror":"https://ror.org/03nb1x490","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Intelligent Analysis and Information Systems","id":"https://openalex.org/I4210144576","relationship":"child","ror":"https://ror.org/04nc32781","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Cell Therapy and Immunology","id":"https://openalex.org/I4210145647","relationship":"child","ror":"https://ror.org/04x45f476","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Ceramic Technologies and Systems","id":"https://openalex.org/I4210145959","relationship":"child","ror":"https://ror.org/0448sak71","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Center for International Management and Knowledge Economy","id":"https://openalex.org/I4210146911","relationship":"child","ror":"https://ror.org/03h61ra63","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Production Systems and Design Technology","id":"https://openalex.org/I4210148503","relationship":"child","ror":"https://ror.org/045eg9c12","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Integrated Systems and Device Technology","id":"https://openalex.org/I4210148684","relationship":"child","ror":"https://ror.org/04q5rka56","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Surface Engineering and Thin Films","id":"https://openalex.org/I4210149217","relationship":"child","ror":"https://ror.org/048vzmn57","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Material and Beam Technology","id":"https://openalex.org/I4210151842","relationship":"child","ror":"https://ror.org/05h8wjh50","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Biomedical Engineering","id":"https://openalex.org/I4210152467","relationship":"child","ror":"https://ror.org/05tpsgh61","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Microstructure of Materials and Systems","id":"https://openalex.org/I4210152728","relationship":"child","ror":"https://ror.org/050mbz718","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Center for Maritime Logistics and Services","id":"https://openalex.org/I4210154173","relationship":"child","ror":"https://ror.org/0525gz420","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Research Institution for Additive Manufacturing Technologies IAPT","id":"https://openalex.org/I4210154327","relationship":"child","ror":"https://ror.org/059ne2r23","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Building Physics","id":"https://openalex.org/I4210157366","relationship":"child","ror":"https://ror.org/04y8p0f91","type":"facility"},{"country_code":"PT","display_name":"Fraunhofer Portugal Research","id":"https://openalex.org/I4210157425","relationship":"child","ror":"https://ror.org/05eqk2j25","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Institute for Silicate Research","id":"https://openalex.org/I4210158088","relationship":"child","ror":"https://ror.org/05gnv4a66","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Energy Economics and Energy System Technology","id":"https://openalex.org/I4210159473","relationship":"child","ror":"https://ror.org/05ptp9d64","type":"facility"},{"country_code":"US","display_name":"Fraunhofer USA","id":"https://openalex.org/I4210161623","relationship":"child","ror":"https://ror.org/05aah2q92","type":"nonprofit"},{"country_code":"DE","display_name":"Fraunhofer Institute for Software and Systems Engineering","id":"https://openalex.org/I4210163630","relationship":"child","ror":"https://ror.org/058kjq542","type":"facility"},{"country_code":"DE","display_name":"Bonn Aachen International Center for Information Technology","id":"https://openalex.org/I4210164149","relationship":"child","ror":"https://ror.org/054zhq066","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Communication, Information Processing and Ergonomics","id":"https://openalex.org/I4210166245","relationship":"child","ror":"https://ror.org/05nn0gw40","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Institute for Casting, Composite and Processing Technology IGCV","id":"https://openalex.org/I4210166696","relationship":"child","ror":"https://ror.org/05xp9bk66","type":"facility"},{"country_code":"DE","display_name":"Fraunhofer Research Institution for Battery Cell Production","id":"https://openalex.org/I4387155775","relationship":"child","ror":"https://ror.org/0118xsm53","type":"facility"}],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4923324/authors","cited_by_count":462739,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4923324/collaborators","country_code":"DE","counts_by_year":[{"cited_by_count":0,"oa_works_count":30,"works_count":33,"year":2026},{"cited_by_count":86,"oa_works_count":172,"works_count":189,"year":2025},{"cited_by_count":478,"oa_works_count":85,"works_count":100,"year":2024},{"cited_by_count":1090,"oa_works_count":59,"works_count":81,"year":2023},{"cited_by_count":2860,"oa_works_count":297,"works_count":326,"year":2022},{"cited_by_count":2179,"oa_works_count":112,"works_count":142,"year":2021},{"cited_by_count":1234,"oa_works_count":132,"works_count":159,"year":2020},{"cited_by_count":1144,"oa_works_count":78,"works_count":102,"year":2019},{"cited_by_count":1655,"oa_works_count":56,"works_count":95,"year":2018},{"cited_by_count":922,"oa_works_count":24,"works_count":51,"year":2017},{"cited_by_count":1110,"oa_works_count":28,"works_count":74,"year":2016},{"cited_by_count":9596,"oa_works_count":139,"works_count":362,"year":2015},{"cited_by_count":14192,"oa_works_count":193,"works_count":523,"year":2014},{"cited_by_count":16359,"oa_works_count":259,"works_count":599,"year":2013},{"cited_by_count":23452,"oa_works_count":228,"works_count":604,"year":2012},{"cited_by_count":9999,"oa_works_count":205,"works_count":521,"year":2011},{"cited_by_count":11793,"oa_works_count":245,"works_count":599,"year":2010}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4923324/counts_by_year","created_date":"2016-06-24T00:00:00.000Z","display_name":"Fraunhofer-Gesellschaft","display_name_acronyms":["FHG"],"display_name_alternatives":["Fraunhofer Society","Fraunhofer-Gesellschaft","Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V."],"geo":{"city":"Munich","country":"Germany","country_code":"DE","geonames_city_id":"2867714","latitude":48.13743,"longitude":11.57549,"region":"Bavaria"},"homepage_url":"https://www.fraunhofer.de","id":"https://openalex.org/I4923324","ids":{"grid":"grid.4561.6","openalex":"https://openalex.org/I4923324","ror":"https://ror.org/05hkkdn48","wikidata":null,"wikipedia":"http://en.wikipedia.org/wiki/Fraunhofer_Society"},"image_thumbnail_url":"https://commons.wikimedia.org/w/index.php?title=Special:Redirect/file/Fraunhofer-logo.svg\u0026width=300","image_url":"https://commons.wikimedia.org/w/index.php?title=Special:Redirect/file/Fraunhofer-logo.svg","is_super_system":false,"lineage":["https://openalex.org/I4923324"],"repositories":[{"display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","host_organization":"https://openalex.org/I4923324","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_name":"Fraunhofer-Gesellschaft","id":"https://openalex.org/S4306400318"},{"display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","host_organization":"https://openalex.org/I4923324","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_name":"Fraunhofer-Gesellschaft","id":"https://openalex.org/S4306400801"}],"roles":[{"id":"https://openalex.org/F4320321773","role":"funder","works_count":2187},{"id":"https://openalex.org/I4923324","role":"institution","works_count":9405}],"ror":"https://ror.org/05hkkdn48","status":"active","summary_stats":{"2yr_mean_citedness":1.5433403805496828,"h_index":234,"i10_index":8155},"topic_share":[{"display_name":"Silicon and Solar Cell Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10624","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.003838},{"display_name":"solar cell performance optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12309","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0025422},{"display_name":"Thin-Film Transistor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10623","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0021932},{"display_name":"Advanced Software Engineering Methodologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10639","subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"},"value":0.0020075},{"display_name":"3D IC and TSV technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11527","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.001856},{"display_name":"Software Engineering Techniques and Practices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10430","subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"},"value":0.0016041},{"display_name":"Silicon Nanostructures and Photoluminescence","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T11169","subfield":{"display_name":"Materials Chemistry","id":"https://openalex.org/subfields/2505"},"value":0.0014744},{"display_name":"Modeling and Simulation Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T13286","subfield":{"display_name":"Computational Theory and Mathematics","id":"https://openalex.org/subfields/1703"},"value":0.0013317},{"display_name":"Electronic Packaging and Soldering Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10460","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.001326},{"display_name":"Safety Systems Engineering in Autonomy","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13295","subfield":{"display_name":"Safety, Risk, Reliability and Quality","id":"https://openalex.org/subfields/2213"},"value":0.0013108},{"display_name":"Model-Driven Software Engineering Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11450","subfield":{"display_name":"Software","id":"https://openalex.org/subfields/1712"},"value":0.0012723},{"display_name":"Business Process Modeling and Analysis","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Business, Management and Accounting","id":"https://openalex.org/fields/14"},"id":"https://openalex.org/T10703","subfield":{"display_name":"Management Information Systems","id":"https://openalex.org/subfields/1404"},"value":0.0012675},{"display_name":"Innovation, Technology, and Society","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Social Sciences","id":"https://openalex.org/fields/33"},"id":"https://openalex.org/T14389","subfield":{"display_name":"Sociology and Political Science","id":"https://openalex.org/subfields/3312"},"value":0.0012661},{"display_name":"Photovoltaic Systems and Sustainability","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Environmental Science","id":"https://openalex.org/fields/23"},"id":"https://openalex.org/T12838","subfield":{"display_name":"Environmental Engineering","id":"https://openalex.org/subfields/2305"},"value":0.0012433},{"display_name":"Flexible and Reconfigurable Manufacturing Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11741","subfield":{"display_name":"Industrial and Manufacturing Engineering","id":"https://openalex.org/subfields/2209"},"value":0.0012415},{"display_name":"Software Engineering Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10260","subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"},"value":0.0012281},{"display_name":"Advanced MEMS and NEMS Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10369","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0012177},{"display_name":"Electrical and Thermal Properties of Materials","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13251","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0011934},{"display_name":"Laser Material Processing Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10732","subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"},"value":0.0011145},{"display_name":"Service-Oriented Architecture and Web Services","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10679","subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"},"value":0.0010569},{"display_name":"Integrated Circuits and Semiconductor Failure Analysis","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14117","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0010004},{"display_name":"Optical Coatings and Gratings","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T11723","subfield":{"display_name":"Surfaces, Coatings and Films","id":"https://openalex.org/subfields/2508"},"value":0.0009833},{"display_name":"Music and Audio Processing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11309","subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"},"value":0.000975},{"display_name":"Software Reliability and Analysis Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12423","subfield":{"display_name":"Software","id":"https://openalex.org/subfields/1712"},"value":0.0009407},{"display_name":"Advancements in Photolithography Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11338","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0009384}],"topics":[{"count":528,"display_name":"Silicon and Solar Cell Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10624","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":322,"display_name":"Thin-Film Transistor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10623","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":244,"display_name":"Photonic and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10299","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":224,"display_name":"Advanced Software Engineering Methodologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10639","score":0.9999,"subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"}},{"count":207,"display_name":"Semiconductor materials and devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10472","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":205,"display_name":"Semiconductor Lasers and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11429","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":204,"display_name":"Service-Oriented Architecture and Web Services","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10679","score":1,"subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"}},{"count":199,"display_name":"Software Engineering Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10260","score":1,"subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"}},{"count":183,"display_name":"Advanced Surface Polishing Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11301","score":1,"subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"}},{"count":175,"display_name":"Integrated Circuits and Semiconductor Failure Analysis","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14117","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":164,"display_name":"Semiconductor materials and interfaces","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11853","score":1,"subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"}},{"count":162,"display_name":"Business Process Modeling and Analysis","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Business, Management and Accounting","id":"https://openalex.org/fields/14"},"id":"https://openalex.org/T10703","score":1,"subfield":{"display_name":"Management Information Systems","id":"https://openalex.org/subfields/1404"}},{"count":160,"display_name":"Silicon Nanostructures and Photoluminescence","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T11169","score":1,"subfield":{"display_name":"Materials Chemistry","id":"https://openalex.org/subfields/2505"}},{"count":158,"display_name":"Software Engineering Techniques and Practices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10430","score":1,"subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"}},{"count":154,"display_name":"solar cell performance optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12309","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":151,"display_name":"Metal and Thin Film Mechanics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10377","score":1,"subfield":{"display_name":"Mechanics of Materials","id":"https://openalex.org/subfields/2211"}},{"count":147,"display_name":"Manufacturing Process and Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11159","score":0.9999,"subfield":{"display_name":"Industrial and Manufacturing Engineering","id":"https://openalex.org/subfields/2209"}},{"count":147,"display_name":"3D IC and TSV technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11527","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":141,"display_name":"Semantic Web and Ontologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10215","score":0.9999,"subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"}},{"count":140,"display_name":"Advanced MEMS and NEMS Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10369","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":128,"display_name":"Advanced Vision and Imaging","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10531","score":1,"subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"}},{"count":126,"display_name":"Electronic Packaging and Soldering Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10460","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":120,"display_name":"Speech and Audio Processing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10860","score":1,"subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"}},{"count":120,"display_name":"Music and Audio Processing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11309","score":1,"subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"}},{"count":116,"display_name":"Laser Material Processing Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10732","score":1,"subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"}}],"type":"government","type_id":"https://openalex.org/institution-types/government","updated_date":"2026-03-30T05:59:38.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4923324/works","works_count":9405}