{"associated_institutions":[],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4403928212/authors","cited_by_count":26,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4403928212/collaborators","country_code":null,"counts_by_year":[{"cited_by_count":4,"oa_works_count":1,"works_count":1,"year":2024},{"cited_by_count":22,"oa_works_count":1,"works_count":2,"year":2020}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4403928212/counts_by_year","created_date":"2024-11-01T01:53:46.000Z","display_name":"inhbar, Inc. (Japan)","display_name_acronyms":[],"display_name_alternatives":["inhbar","inhbar, Inc.","inhbar, Inc. (Japan)","インエイチバー合同会社"],"geo":{"city":"Tokyo","country":"Japan","country_code":null,"geonames_city_id":null,"latitude":35.68949890136719,"longitude":139.69171142578125,"region":null},"homepage_url":"https://www.inhbar.com","id":"https://openalex.org/I4403928212","ids":{"grid":null,"openalex":"https://openalex.org/I4403928212","ror":"https://ror.org/00jpm9b26","wikidata":null,"wikipedia":null},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I4403928212"],"repositories":[],"roles":[{"id":"https://openalex.org/I4403928212","role":"institution","works_count":3}],"ror":"https://ror.org/00jpm9b26","summary_stats":{"2yr_mean_citedness":4,"h_index":2,"i10_index":1},"topic_share":[{"display_name":"Optical Systems and Laser Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14158","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000251},{"display_name":"Adaptive optics and wavefront sensing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11484","subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"},"value":0.0000136},{"display_name":"Surface Roughness and Optical Measurements","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13049","subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"},"value":0.00001},{"display_name":"Solid State Laser Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11127","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000088},{"display_name":"Geophysics and Sensor Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13885","subfield":{"display_name":"Ocean Engineering","id":"https://openalex.org/subfields/2212"},"value":0.0000088},{"display_name":"Pulsars and Gravitational Waves Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10463","subfield":{"display_name":"Astronomy and Astrophysics","id":"https://openalex.org/subfields/3103"},"value":0.0000085},{"display_name":"Optical measurement and interference techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10638","subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"},"value":0.0000073},{"display_name":"Seismic Waves and Analysis","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Earth and Planetary Sciences","id":"https://openalex.org/fields/19"},"id":"https://openalex.org/T11757","subfield":{"display_name":"Geophysics","id":"https://openalex.org/subfields/1908"},"value":0.0000021}],"topics":[{"count":2,"display_name":"Optical Systems and Laser Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14158","score":0.9992,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Pulsars and Gravitational Waves Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10463","score":1,"subfield":{"display_name":"Astronomy and Astrophysics","id":"https://openalex.org/subfields/3103"}},{"count":1,"display_name":"Optical measurement and interference techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10638","score":0.9992,"subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"}},{"count":1,"display_name":"Solid State Laser Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11127","score":0.9984,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Adaptive optics and wavefront sensing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11484","score":0.9998,"subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"}},{"count":1,"display_name":"Seismic Waves and Analysis","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Earth and Planetary Sciences","id":"https://openalex.org/fields/19"},"id":"https://openalex.org/T11757","score":0.9778,"subfield":{"display_name":"Geophysics","id":"https://openalex.org/subfields/1908"}},{"count":1,"display_name":"Surface Roughness and Optical Measurements","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13049","score":0.9983,"subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"}},{"count":1,"display_name":"Geophysics and Sensor Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13885","score":0.9767,"subfield":{"display_name":"Ocean Engineering","id":"https://openalex.org/subfields/2212"}}],"type":"company","type_id":"https://openalex.org/institution-types/company","updated_date":"2026-02-06T19:53:56.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4403928212/works","works_count":3}