{"associated_institutions":[{"country_code":"US","display_name":"United States Army Test and Evaluation Command","id":"https://openalex.org/I4388482654","relationship":"parent","ror":"https://ror.org/0189w2q14","type":"government"}],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4389425277/authors","cited_by_count":28,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4389425277/collaborators","country_code":null,"counts_by_year":[{"cited_by_count":0,"oa_works_count":0,"works_count":1,"year":2025},{"cited_by_count":1,"oa_works_count":0,"works_count":1,"year":2024},{"cited_by_count":0,"oa_works_count":0,"works_count":2,"year":2023},{"cited_by_count":0,"oa_works_count":0,"works_count":1,"year":2022},{"cited_by_count":7,"oa_works_count":1,"works_count":2,"year":2021},{"cited_by_count":1,"oa_works_count":0,"works_count":1,"year":2020},{"cited_by_count":0,"oa_works_count":0,"works_count":1,"year":2015},{"cited_by_count":0,"oa_works_count":0,"works_count":1,"year":2013},{"cited_by_count":5,"oa_works_count":1,"works_count":2,"year":2012},{"cited_by_count":2,"oa_works_count":0,"works_count":1,"year":2011},{"cited_by_count":3,"oa_works_count":0,"works_count":4,"year":2010}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4389425277/counts_by_year","created_date":"2023-12-07T23:58:51.000Z","display_name":"U.S. Army Redstone Test Center","display_name_acronyms":["RTC"],"display_name_alternatives":["Redstone Test Center","U.S. Army Redstone Test Center","United States Army Redstone Test Center"],"geo":{"city":"Redstone Arsenal","country":"United States","country_code":null,"geonames_city_id":null,"latitude":34.683868408203125,"longitude":-86.64763641357422,"region":null},"homepage_url":"https://www.atec.army.mil/rtc/","id":"https://openalex.org/I4389425277","ids":{"grid":null,"openalex":"https://openalex.org/I4389425277","ror":"https://ror.org/00k44np55","wikidata":null,"wikipedia":"https://en.wikipedia.org/wiki/U.S._Army_Redstone_Test_Center"},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I4388482654","https://openalex.org/I4389425277"],"repositories":[],"roles":[{"id":"https://openalex.org/I4389425277","role":"institution","works_count":17}],"ror":"https://ror.org/00k44np55","summary_stats":{"2yr_mean_citedness":0.3333333333333333,"h_index":3,"i10_index":0},"topic_share":[{"display_name":"Diverse Scientific and Engineering Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13307","subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"},"value":0.0003207},{"display_name":"Engineering and Test Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13293","subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"},"value":0.0000672},{"display_name":"Electromagnetic Compatibility and Measurements","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11851","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.000033},{"display_name":"Control Systems in Engineering","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13644","subfield":{"display_name":"Mechanical Engineering","id":"https://openalex.org/subfields/2210"},"value":0.0000329},{"display_name":"Infrared Target Detection Methodologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12389","subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"},"value":0.0000309},{"display_name":"Thermography and Photoacoustic Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11856","subfield":{"display_name":"Mechanics of Materials","id":"https://openalex.org/subfields/2211"},"value":0.0000275},{"display_name":"Scientific Measurement and Uncertainty Evaluation","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Decision Sciences","id":"https://openalex.org/fields/18"},"id":"https://openalex.org/T11890","subfield":{"display_name":"Statistics, Probability and Uncertainty","id":"https://openalex.org/subfields/1804"},"value":0.0000256},{"display_name":"Calibration and Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12019","subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"},"value":0.0000232},{"display_name":"Advanced Electrical Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12300","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000222},{"display_name":"Thermal Analysis in Power Transmission","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12804","subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"},"value":0.0000197},{"display_name":"Air Traffic Management and Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11489","subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"},"value":0.0000192},{"display_name":"Microwave and Dielectric Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11607","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000187},{"display_name":"Aerospace and Aviation Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12125","subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"},"value":0.0000187},{"display_name":"Quality and Safety in Healthcare","domain":{"display_name":"Health Sciences","id":"https://openalex.org/domains/4"},"field":{"display_name":"Health Professions","id":"https://openalex.org/fields/36"},"id":"https://openalex.org/T13690","subfield":{"display_name":"Medical Laboratory Technology","id":"https://openalex.org/subfields/3607"},"value":0.0000158},{"display_name":"Advanced Measurement and Detection Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14257","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000151},{"display_name":"Hydraulic and Pneumatic Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11372","subfield":{"display_name":"Mechanical Engineering","id":"https://openalex.org/subfields/2210"},"value":0.0000142},{"display_name":"Information and Cyber Security","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10734","subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"},"value":0.0000138},{"display_name":"Scientific Research and Discoveries","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T13126","subfield":{"display_name":"Statistical and Nonlinear Physics","id":"https://openalex.org/subfields/3109"},"value":0.0000133},{"display_name":"Vehicle Dynamics and Control Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10805","subfield":{"display_name":"Automotive Engineering","id":"https://openalex.org/subfields/2203"},"value":0.0000128},{"display_name":"Advanced Image Fusion Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11659","subfield":{"display_name":"Media Technology","id":"https://openalex.org/subfields/2214"},"value":0.0000116},{"display_name":"Engineering Applied Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14156","subfield":{"display_name":"Civil and Structural Engineering","id":"https://openalex.org/subfields/2205"},"value":0.0000114},{"display_name":"Robotic Mechanisms and Dynamics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10571","subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"},"value":0.0000112},{"display_name":"Software-Defined Networks and 5G","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10714","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.0000106},{"display_name":"Real-time simulation and control systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12810","subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"},"value":0.0000105},{"display_name":"Mechanical Engineering and Vibrations Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12907","subfield":{"display_name":"Mechanical Engineering","id":"https://openalex.org/subfields/2210"},"value":0.0000102}],"topics":[{"count":3,"display_name":"Infrared Target Detection Methodologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12389","score":0.9999,"subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"}},{"count":2,"display_name":"Structural Health Monitoring Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10534","score":0.9953,"subfield":{"display_name":"Civil and Structural Engineering","id":"https://openalex.org/subfields/2205"}},{"count":2,"display_name":"Hydraulic and Pneumatic Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11372","score":0.9993,"subfield":{"display_name":"Mechanical Engineering","id":"https://openalex.org/subfields/2210"}},{"count":2,"display_name":"Electromagnetic Compatibility and Measurements","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11851","score":0.996,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":2,"display_name":"Thermography and Photoacoustic Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11856","score":0.9938,"subfield":{"display_name":"Mechanics of Materials","id":"https://openalex.org/subfields/2211"}},{"count":2,"display_name":"Scientific Measurement and Uncertainty Evaluation","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Decision Sciences","id":"https://openalex.org/fields/18"},"id":"https://openalex.org/T11890","score":0.9869,"subfield":{"display_name":"Statistics, Probability and Uncertainty","id":"https://openalex.org/subfields/1804"}},{"count":2,"display_name":"Calibration and Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12019","score":0.9982,"subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"}},{"count":2,"display_name":"Scientific Research and Discoveries","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T13126","score":0.9965,"subfield":{"display_name":"Statistical and Nonlinear Physics","id":"https://openalex.org/subfields/3109"}},{"count":2,"display_name":"Engineering and Test Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13293","score":0.9693,"subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"}},{"count":2,"display_name":"Diverse Scientific and Engineering Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13307","score":0.9943,"subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"}},{"count":2,"display_name":"Advanced Measurement and Detection Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14257","score":0.9989,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Cloud Computing and Resource Management","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10101","score":0.9945,"subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"}},{"count":1,"display_name":"Photonic and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10299","score":0.7518,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Semiconductor materials and devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10472","score":0.9996,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Advancements in Semiconductor Devices and Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10558","score":0.9972,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Robotic Mechanisms and Dynamics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10571","score":0.9962,"subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"}},{"count":1,"display_name":"Software-Defined Networks and 5G","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10714","score":0.99,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}},{"count":1,"display_name":"Information and Cyber Security","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10734","score":0.9955,"subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"}},{"count":1,"display_name":"Vehicle Dynamics and Control Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10805","score":0.9326,"subfield":{"display_name":"Automotive Engineering","id":"https://openalex.org/subfields/2203"}},{"count":1,"display_name":"Advanced Data Storage Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11181","score":0.9987,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}},{"count":1,"display_name":"Advanced Surface Polishing Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11301","score":0.9878,"subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"}},{"count":1,"display_name":"Advanced Antenna and Metasurface Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11383","score":0.9637,"subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"}},{"count":1,"display_name":"Energy Harvesting in Wireless Networks","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11392","score":0.9841,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Air Traffic Management and Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11489","score":0.9479,"subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"}},{"count":1,"display_name":"Microwave and Dielectric Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11607","score":0.8336,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}}],"type":"facility","type_id":"https://openalex.org/institution-types/facility","updated_date":"2026-02-06T19:53:56.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4389425277/works","works_count":17}