{"associated_institutions":[],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387155328/authors","cited_by_count":225,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387155328/collaborators","country_code":null,"counts_by_year":[{"cited_by_count":2,"oa_works_count":1,"works_count":1,"year":2021},{"cited_by_count":0,"oa_works_count":1,"works_count":1,"year":2019},{"cited_by_count":2,"oa_works_count":1,"works_count":1,"year":2018},{"cited_by_count":3,"oa_works_count":3,"works_count":3,"year":2016},{"cited_by_count":64,"oa_works_count":1,"works_count":1,"year":2014},{"cited_by_count":3,"oa_works_count":0,"works_count":1,"year":2013},{"cited_by_count":20,"oa_works_count":0,"works_count":2,"year":2011},{"cited_by_count":3,"oa_works_count":0,"works_count":1,"year":2010}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387155328/counts_by_year","created_date":"2023-09-29T19:15:43.000Z","display_name":"Instrumentation Technologies (Slovenia)","display_name_acronyms":[],"display_name_alternatives":["Instrumentation Technologies","Instrumentation Technologies (Slovenia)"],"geo":{"city":"Solkan","country":"Slovenia","country_code":null,"geonames_city_id":null,"latitude":45.97138977050781,"longitude":13.649439811706543,"region":null},"homepage_url":"https://www.i-tech.si","id":"https://openalex.org/I4387155328","ids":{"grid":null,"openalex":"https://openalex.org/I4387155328","ror":"https://ror.org/027bk6125","wikidata":null,"wikipedia":null},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I4387155328"],"repositories":[],"roles":[{"id":"https://openalex.org/I4387155328","role":"institution","works_count":20}],"ror":"https://ror.org/027bk6125","summary_stats":{"2yr_mean_citedness":0,"h_index":7,"i10_index":7},"topic_share":[{"display_name":"Environmental Sustainability and Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Environmental Science","id":"https://openalex.org/fields/23"},"id":"https://openalex.org/T13432","subfield":{"display_name":"Management, Monitoring, Policy and Law","id":"https://openalex.org/subfields/2308"},"value":0.0000767},{"display_name":"Advancements in PLL and VCO Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11417","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.000041},{"display_name":"Photocathodes and Microchannel Plates","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13418","subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"},"value":0.0000319},{"display_name":"Process Optimization and Integration","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11053","subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"},"value":0.0000253},{"display_name":"Economic and Technological Systems Analysis","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Business, Management and Accounting","id":"https://openalex.org/fields/14"},"id":"https://openalex.org/T13181","subfield":{"display_name":"Management of Technology and Innovation","id":"https://openalex.org/subfields/1405"},"value":0.0000243},{"display_name":"Engineering Technology and Methodologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13113","subfield":{"display_name":"Industrial and Manufacturing Engineering","id":"https://openalex.org/subfields/2209"},"value":0.0000234},{"display_name":"Flexible and Reconfigurable Manufacturing Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11741","subfield":{"display_name":"Industrial and Manufacturing Engineering","id":"https://openalex.org/subfields/2209"},"value":0.0000233},{"display_name":"Injection Molding Process and Properties","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12080","subfield":{"display_name":"Mechanical Engineering","id":"https://openalex.org/subfields/2210"},"value":0.0000194},{"display_name":"Microwave and Dielectric Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11607","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000187},{"display_name":"Particle Detector Development and Performance","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11044","subfield":{"display_name":"Nuclear and High Energy Physics","id":"https://openalex.org/subfields/3106"},"value":0.0000184},{"display_name":"Digital Filter Design and Implementation","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11034","subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"},"value":0.0000172},{"display_name":"Economic and Technological Developments in Russia","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Social Sciences","id":"https://openalex.org/fields/33"},"id":"https://openalex.org/T12667","subfield":{"display_name":"Development","id":"https://openalex.org/subfields/3303"},"value":0.0000168},{"display_name":"Advanced Adaptive Filtering Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11233","subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"},"value":0.0000111},{"display_name":"Gyrotron and Vacuum Electronics Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11175","subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"},"value":0.0000104},{"display_name":"VLSI and Analog Circuit Testing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11032","subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"},"value":0.0000103},{"display_name":"Semiconductor Lasers and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11429","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000101},{"display_name":"Advanced Control Systems Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10791","subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"},"value":0.00001},{"display_name":"Particle Accelerators and Free-Electron Lasers","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10559","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000078},{"display_name":"Radio Frequency Integrated Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10187","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000073},{"display_name":"Embedded Systems Design Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10904","subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"},"value":0.0000071},{"display_name":"Radiation Detection and Scintillator Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11216","subfield":{"display_name":"Radiation","id":"https://openalex.org/subfields/3108"},"value":0.0000065},{"display_name":"Image and Signal Denoising Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10688","subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"},"value":0.0000055},{"display_name":"Additive Manufacturing and 3D Printing Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10783","subfield":{"display_name":"Automotive Engineering","id":"https://openalex.org/subfields/2203"},"value":0.0000053},{"display_name":"Particle accelerators and beam dynamics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11367","subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"},"value":0.000005},{"display_name":"Atomic and Subatomic Physics Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11993","subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"},"value":0.0000046}],"topics":[{"count":6,"display_name":"Particle accelerators and beam dynamics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11367","score":0.9999,"subfield":{"display_name":"Aerospace Engineering","id":"https://openalex.org/subfields/2202"}},{"count":5,"display_name":"Particle Accelerators and Free-Electron Lasers","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10559","score":0.9999,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":3,"display_name":"Particle Detector Development and Performance","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11044","score":0.9977,"subfield":{"display_name":"Nuclear and High Energy Physics","id":"https://openalex.org/subfields/3106"}},{"count":3,"display_name":"Gyrotron and Vacuum Electronics Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11175","score":0.9968,"subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"}},{"count":3,"display_name":"Advancements in PLL and VCO Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11417","score":0.9963,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":3,"display_name":"Semiconductor Lasers and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11429","score":0.9993,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":2,"display_name":"Advanced Control Systems Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10791","score":0.9996,"subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"}},{"count":2,"display_name":"Process Optimization and Integration","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11053","score":0.9784,"subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"}},{"count":2,"display_name":"Flexible and Reconfigurable Manufacturing Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11741","score":0.9948,"subfield":{"display_name":"Industrial and Manufacturing Engineering","id":"https://openalex.org/subfields/2209"}},{"count":2,"display_name":"Engineering Technology and Methodologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13113","score":0.9102,"subfield":{"display_name":"Industrial and Manufacturing Engineering","id":"https://openalex.org/subfields/2209"}},{"count":1,"display_name":"Radio Frequency Integrated Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10187","score":0.9996,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Advanced biosensing and bioanalysis techniques","domain":{"display_name":"Life Sciences","id":"https://openalex.org/domains/1"},"field":{"display_name":"Biochemistry, Genetics and Molecular Biology","id":"https://openalex.org/fields/13"},"id":"https://openalex.org/T10207","score":1,"subfield":{"display_name":"Molecular Biology","id":"https://openalex.org/subfields/1312"}},{"count":1,"display_name":"Microwave Engineering and Waveguides","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10262","score":0.9975,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Photonic and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10299","score":0.7131,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"DNA and Nucleic Acid Chemistry","domain":{"display_name":"Life Sciences","id":"https://openalex.org/domains/1"},"field":{"display_name":"Biochemistry, Genetics and Molecular Biology","id":"https://openalex.org/fields/13"},"id":"https://openalex.org/T10432","score":0.999,"subfield":{"display_name":"Molecular Biology","id":"https://openalex.org/subfields/1312"}},{"count":1,"display_name":"Image and Signal Denoising Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10688","score":0.9899,"subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"}},{"count":1,"display_name":"RNA Interference and Gene Delivery","domain":{"display_name":"Life Sciences","id":"https://openalex.org/domains/1"},"field":{"display_name":"Biochemistry, Genetics and Molecular Biology","id":"https://openalex.org/fields/13"},"id":"https://openalex.org/T10725","score":0.9991,"subfield":{"display_name":"Molecular Biology","id":"https://openalex.org/subfields/1312"}},{"count":1,"display_name":"Additive Manufacturing and 3D Printing Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10783","score":0.996,"subfield":{"display_name":"Automotive Engineering","id":"https://openalex.org/subfields/2203"}},{"count":1,"display_name":"Embedded Systems Design Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10904","score":0.9988,"subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"}},{"count":1,"display_name":"Advanced Fiber Laser Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10988","score":0.9995,"subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"}},{"count":1,"display_name":"VLSI and Analog Circuit Testing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11032","score":0.9991,"subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"}},{"count":1,"display_name":"Digital Filter Design and Implementation","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11034","score":0.9995,"subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"}},{"count":1,"display_name":"Manufacturing Process and Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11159","score":0.9973,"subfield":{"display_name":"Industrial and Manufacturing Engineering","id":"https://openalex.org/subfields/2209"}},{"count":1,"display_name":"Radiation Detection and Scintillator Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11216","score":0.9835,"subfield":{"display_name":"Radiation","id":"https://openalex.org/subfields/3108"}},{"count":1,"display_name":"Advanced Adaptive Filtering Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11233","score":0.995,"subfield":{"display_name":"Computational Mechanics","id":"https://openalex.org/subfields/2206"}}],"type":"company","type_id":"https://openalex.org/institution-types/company","updated_date":"2026-02-06T19:53:56.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387155328/works","works_count":20}