{"associated_institutions":[],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387153081/authors","cited_by_count":5,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387153081/collaborators","country_code":null,"counts_by_year":[{"cited_by_count":3,"oa_works_count":0,"works_count":1,"year":2017},{"cited_by_count":2,"oa_works_count":0,"works_count":1,"year":2011}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387153081/counts_by_year","created_date":"2023-09-29T19:15:43.000Z","display_name":"Department of Measurement Units, Standards \u0026 Services","display_name_acronyms":["MUSSD"],"display_name_alternatives":["Department of Measurement Units, Standards \u0026 Services","Department of Measurement Units, Standards and Services","Measurement Units Standards and Services Department","National Metrology Institute of Sri Lanka","அளக்கும் அலகுகள், தரங்கள் மற்றும் சேவைகள் திணைக்களம்","නුම් ඒකක, ප්රමිති හා සේවා දෙපාර්තමේන්තුව"],"geo":{"city":"Pitipana Town","country":"Sri Lanka","country_code":null,"geonames_city_id":null,"latitude":6.843929767608643,"longitude":80.02124786376953,"region":null},"homepage_url":"https://www.measurementsdept.gov.lk","id":"https://openalex.org/I4387153081","ids":{"grid":null,"openalex":"https://openalex.org/I4387153081","ror":"https://ror.org/02jhg8z64","wikidata":null,"wikipedia":null},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I4387153081"],"repositories":[],"roles":[{"id":"https://openalex.org/I4387153081","role":"institution","works_count":2}],"ror":"https://ror.org/02jhg8z64","summary_stats":{"2yr_mean_citedness":0,"h_index":2,"i10_index":0},"topic_share":[{"display_name":"Advanced Electrical Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12300","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000222},{"display_name":"Scientific Measurement and Uncertainty Evaluation","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Decision Sciences","id":"https://openalex.org/fields/18"},"id":"https://openalex.org/T11890","subfield":{"display_name":"Statistics, Probability and Uncertainty","id":"https://openalex.org/subfields/1804"},"value":0.0000128},{"display_name":"Analog and Mixed-Signal Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10323","subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"},"value":0.0000085},{"display_name":"Sensor Technology and Measurement Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12564","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.0000085}],"topics":[{"count":1,"display_name":"Analog and Mixed-Signal Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10323","score":0.9996,"subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"}},{"count":1,"display_name":"Scientific Measurement and Uncertainty Evaluation","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Decision Sciences","id":"https://openalex.org/fields/18"},"id":"https://openalex.org/T11890","score":0.9899,"subfield":{"display_name":"Statistics, Probability and Uncertainty","id":"https://openalex.org/subfields/1804"}},{"count":1,"display_name":"Advanced Electrical Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12300","score":0.9969,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Sensor Technology and Measurement Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12564","score":0.9976,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}}],"type":"government","type_id":"https://openalex.org/institution-types/government","updated_date":"2026-02-06T19:53:56.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387153081/works","works_count":2}