{"associated_institutions":[],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387152465/authors","cited_by_count":15,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387152465/collaborators","country_code":null,"counts_by_year":[],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387152465/counts_by_year","created_date":"2023-09-29T19:15:43.000Z","display_name":"National Standards and Calibration Laboratory","display_name_acronyms":["NSCL"],"display_name_alternatives":["National Standards and Calibration Laboratory","المخبر الوطني للمعايير والمعايرة آر.إس.إس"],"geo":{"city":"Damascus","country":"Syria","country_code":null,"geonames_city_id":null,"latitude":33.51020050048828,"longitude":36.29127883911133,"region":null},"homepage_url":"http://nscl.sy","id":"https://openalex.org/I4387152465","ids":{"grid":null,"openalex":"https://openalex.org/I4387152465","ror":"https://ror.org/04ahe1r73","wikidata":null,"wikipedia":null},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I4387152465"],"repositories":[],"roles":[{"id":"https://openalex.org/I4387152465","role":"institution","works_count":3}],"ror":"https://ror.org/04ahe1r73","summary_stats":{"2yr_mean_citedness":0,"h_index":1,"i10_index":1},"topic_share":[{"display_name":"Advanced Electrical Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12300","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000443},{"display_name":"Scientific Measurement and Uncertainty Evaluation","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Decision Sciences","id":"https://openalex.org/fields/18"},"id":"https://openalex.org/T11890","subfield":{"display_name":"Statistics, Probability and Uncertainty","id":"https://openalex.org/subfields/1804"},"value":0.0000256},{"display_name":"Sensor Technology and Measurement Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12564","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.000017},{"display_name":"Advanced Sensor Technologies Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13928","subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"},"value":0.0000156},{"display_name":"Magneto-Optical Properties and Applications","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12510","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000057},{"display_name":"Analytical Chemistry and Sensors","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Chemical Engineering","id":"https://openalex.org/fields/15"},"id":"https://openalex.org/T11472","subfield":{"display_name":"Bioengineering","id":"https://openalex.org/subfields/1502"},"value":0.000003}],"topics":[{"count":2,"display_name":"Scientific Measurement and Uncertainty Evaluation","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Decision Sciences","id":"https://openalex.org/fields/18"},"id":"https://openalex.org/T11890","score":0.9998,"subfield":{"display_name":"Statistics, Probability and Uncertainty","id":"https://openalex.org/subfields/1804"}},{"count":2,"display_name":"Advanced Electrical Measurement Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12300","score":0.9997,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":2,"display_name":"Sensor Technology and Measurement Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12564","score":0.9982,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}},{"count":1,"display_name":"Analytical Chemistry and Sensors","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Chemical Engineering","id":"https://openalex.org/fields/15"},"id":"https://openalex.org/T11472","score":0.9815,"subfield":{"display_name":"Bioengineering","id":"https://openalex.org/subfields/1502"}},{"count":1,"display_name":"Magneto-Optical Properties and Applications","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12510","score":0.9872,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Advanced Sensor Technologies Research","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13928","score":0.9876,"subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"}}],"type":"government","type_id":"https://openalex.org/institution-types/government","updated_date":"2026-02-06T19:53:56.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4387152465/works","works_count":3}