{"associated_institutions":[],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210166664/authors","cited_by_count":13,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210166664/collaborators","country_code":"MM","counts_by_year":[{"cited_by_count":4,"oa_works_count":1,"works_count":1,"year":2021},{"cited_by_count":4,"oa_works_count":3,"works_count":4,"year":2020},{"cited_by_count":1,"oa_works_count":1,"works_count":1,"year":2019}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210166664/counts_by_year","created_date":"2022-02-02T04:48:36.000Z","display_name":"Taungoo Technological University","display_name_acronyms":[],"display_name_alternatives":["Taungoo Technological University"],"geo":{"city":"Taungoo","country":"Myanmar","country_code":"MM","geonames_city_id":"1290596","latitude":18.942909240722656,"longitude":96.43408203125,"region":null},"homepage_url":null,"id":"https://openalex.org/I4210166664","ids":{"grid":"grid.449694.2","openalex":"https://openalex.org/I4210166664","ror":"https://ror.org/014gnqa09","wikidata":null,"wikipedia":""},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I4210166664"],"repositories":[],"roles":[{"id":"https://openalex.org/I4210166664","role":"institution","works_count":6}],"ror":"https://ror.org/014gnqa09","summary_stats":{"2yr_mean_citedness":0,"h_index":3,"i10_index":0},"topic_share":[{"display_name":"Wireless Sensor Networks and IoT","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13535","subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"},"value":0.0000257},{"display_name":"Induction Heating and Inverter Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12898","subfield":{"display_name":"Mechanical Engineering","id":"https://openalex.org/subfields/2210"},"value":0.0000167},{"display_name":"Dyeing and Modifying Textile Fibers","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11511","subfield":{"display_name":"Building and Construction","id":"https://openalex.org/subfields/2215"},"value":0.0000166},{"display_name":"Advanced Measurement and Detection Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14257","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000075},{"display_name":"GaN-based semiconductor devices and materials","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10099","subfield":{"display_name":"Condensed Matter Physics","id":"https://openalex.org/subfields/3104"},"value":0.0000069},{"display_name":"Video Surveillance and Tracking Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10331","subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"},"value":0.0000069},{"display_name":"Silicon Carbide Semiconductor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10361","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000069},{"display_name":"Advanced DC-DC Converters","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10175","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000065},{"display_name":"Advanced Vision and Imaging","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10531","subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"},"value":0.0000048},{"display_name":"Advancements in Semiconductor Devices and Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10558","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000046},{"display_name":"Semiconductor Quantum Structures and Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10022","subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"},"value":0.0000024}],"topics":[{"count":1,"display_name":"Semiconductor Quantum Structures and Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10022","score":0.9775,"subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"}},{"count":1,"display_name":"GaN-based semiconductor devices and materials","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10099","score":0.8916,"subfield":{"display_name":"Condensed Matter Physics","id":"https://openalex.org/subfields/3104"}},{"count":1,"display_name":"Advanced DC-DC Converters","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10175","score":0.9944,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Video Surveillance and Tracking Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10331","score":0.9751,"subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"}},{"count":1,"display_name":"Silicon Carbide Semiconductor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10361","score":0.9842,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Advanced Vision and Imaging","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10531","score":0.9599,"subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"}},{"count":1,"display_name":"Advancements in Semiconductor Devices and Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10558","score":0.9841,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Dyeing and Modifying Textile Fibers","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11511","score":0.7438,"subfield":{"display_name":"Building and Construction","id":"https://openalex.org/subfields/2215"}},{"count":1,"display_name":"Induction Heating and Inverter Technology","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12898","score":0.9892,"subfield":{"display_name":"Mechanical Engineering","id":"https://openalex.org/subfields/2210"}},{"count":1,"display_name":"Wireless Sensor Networks and IoT","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T13535","score":0.0671,"subfield":{"display_name":"Control and Systems Engineering","id":"https://openalex.org/subfields/2207"}},{"count":1,"display_name":"Advanced Measurement and Detection Methods","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14257","score":0.9777,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}}],"type":"education","type_id":"https://openalex.org/institution-types/education","updated_date":"2026-02-06T19:53:56.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210166664/works","works_count":6}