{"associated_institutions":[],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210162441/authors","cited_by_count":30,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210162441/collaborators","country_code":"US","counts_by_year":[{"cited_by_count":6,"oa_works_count":1,"works_count":1,"year":2025}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210162441/counts_by_year","created_date":"2022-02-02T04:48:36.000Z","display_name":"TransDigm Group (United States)","display_name_acronyms":[],"display_name_alternatives":["TransDigm Group (United States)"],"geo":{"city":"Cleveland","country":"United States","country_code":"US","geonames_city_id":"5150529","latitude":41.4995002746582,"longitude":-81.6954116821289,"region":null},"homepage_url":"https://www.transdigm.com/","id":"https://openalex.org/I4210162441","ids":{"grid":"grid.507572.2","openalex":"https://openalex.org/I4210162441","ror":"https://ror.org/05bcm4543","wikidata":null,"wikipedia":"https://en.wikipedia.org/wiki/TransDigm_Group"},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I4210162441"],"repositories":[],"roles":[{"id":"https://openalex.org/I4210162441","role":"institution","works_count":1}],"ror":"https://ror.org/05bcm4543","summary_stats":{"2yr_mean_citedness":6,"h_index":5,"i10_index":0},"topic_share":[{"display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12122","subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"},"value":0.0000277},{"display_name":"Electrostatic Discharge in Electronics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12495","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.000014},{"display_name":"Radiation Effects in Electronics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11005","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000134}],"topics":[{"count":1,"display_name":"Radiation Effects in Electronics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11005","score":0.9992,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":1,"display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12122","score":0.9049,"subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"}},{"count":1,"display_name":"Electrostatic Discharge in Electronics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12495","score":0.9742,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}}],"type":"company","type_id":"https://openalex.org/institution-types/company","updated_date":"2026-02-06T19:53:56.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210162441/works","works_count":1}