{"associated_institutions":[{"country_code":"US","display_name":"Ciena (United States)","id":"https://openalex.org/I1295297804","relationship":"parent","ror":"https://ror.org/05w425588","type":"company"}],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210160469/authors","cited_by_count":13591,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210160469/collaborators","country_code":"CA","counts_by_year":[{"cited_by_count":0,"oa_works_count":1,"works_count":3,"year":2026},{"cited_by_count":19,"oa_works_count":2,"works_count":33,"year":2025},{"cited_by_count":142,"oa_works_count":7,"works_count":34,"year":2024},{"cited_by_count":497,"oa_works_count":9,"works_count":34,"year":2023},{"cited_by_count":380,"oa_works_count":9,"works_count":32,"year":2022},{"cited_by_count":220,"oa_works_count":13,"works_count":31,"year":2021},{"cited_by_count":361,"oa_works_count":7,"works_count":45,"year":2020},{"cited_by_count":450,"oa_works_count":4,"works_count":29,"year":2019},{"cited_by_count":483,"oa_works_count":5,"works_count":26,"year":2018},{"cited_by_count":952,"oa_works_count":8,"works_count":45,"year":2017},{"cited_by_count":1098,"oa_works_count":5,"works_count":29,"year":2016},{"cited_by_count":341,"oa_works_count":2,"works_count":28,"year":2015},{"cited_by_count":447,"oa_works_count":4,"works_count":21,"year":2014},{"cited_by_count":459,"oa_works_count":4,"works_count":22,"year":2013},{"cited_by_count":271,"oa_works_count":1,"works_count":17,"year":2012},{"cited_by_count":313,"oa_works_count":4,"works_count":29,"year":2011},{"cited_by_count":255,"oa_works_count":1,"works_count":12,"year":2010}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210160469/counts_by_year","created_date":"2022-02-02T04:48:36.000Z","display_name":"Ciena (Canada)","display_name_acronyms":[],"display_name_alternatives":["Ciena (Canada)"],"geo":{"city":"Ottawa","country":"Canada","country_code":"CA","geonames_city_id":"6094817","latitude":45.35213851928711,"longitude":-75.8542251586914,"region":"Ontario"},"homepage_url":"http://www.ciena.ca/","id":"https://openalex.org/I4210160469","ids":{"grid":"grid.450650.2","openalex":"https://openalex.org/I4210160469","ror":"https://ror.org/05agqdk49","wikidata":null,"wikipedia":"https://en.wikipedia.org/wiki/Ciena"},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I1295297804","https://openalex.org/I4210160469"],"repositories":[],"roles":[{"id":"https://openalex.org/I4210160469","role":"institution","works_count":477}],"ror":"https://ror.org/05agqdk49","status":"active","summary_stats":{"2yr_mean_citedness":1.8805970149253732,"h_index":59,"i10_index":299},"topic_share":[{"display_name":"Advanced Photonic Communication Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10767","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.001153},{"display_name":"Advanced Optical Network Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10847","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.001128},{"display_name":"Optical Network Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10232","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0009},{"display_name":"Advancements in PLL and VCO Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11417","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0003743},{"display_name":"Software-Defined Networks and 5G","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10714","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.0003575},{"display_name":"Semiconductor Lasers and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11429","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0002404},{"display_name":"PAPR reduction in OFDM","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11873","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0002389},{"display_name":"Advanced Fiber Laser Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10988","subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"},"value":0.0002285},{"display_name":"Analog and Mixed-Signal Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10323","subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"},"value":0.0002095},{"display_name":"Photonic and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10299","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0001939},{"display_name":"Software System Performance and Reliability","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12127","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.0001328},{"display_name":"Radio Frequency Integrated Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10187","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.000123},{"display_name":"3D IC and TSV technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11527","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0001136},{"display_name":"Neural Networks and Reservoir Computing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12611","subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"},"value":0.0001129},{"display_name":"Network Security and Intrusion Detection","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10400","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.0001052},{"display_name":"Electromagnetic Compatibility and Noise Suppression","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11444","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000931},{"display_name":"Low-power high-performance VLSI design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10363","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000906},{"display_name":"Age of Information Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T13553","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.0000883},{"display_name":"VLSI and Analog Circuit Testing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11032","subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"},"value":0.0000809},{"display_name":"Advanced Fiber Optic Sensors","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10205","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000769},{"display_name":"Optical Coherence Tomography Applications","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11569","subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"},"value":0.0000765},{"display_name":"Wireless Communication Security Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10964","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000762},{"display_name":"Internet Traffic Analysis and Secure E-voting","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11598","subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"},"value":0.0000747},{"display_name":"Error Correcting Code Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11321","subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"},"value":0.0000743},{"display_name":"Photonic Crystal and Fiber Optics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10846","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0000723}],"topics":[{"count":255,"display_name":"Optical Network Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10232","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":182,"display_name":"Advanced Photonic Communication Systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10767","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":110,"display_name":"Photonic and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10299","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":108,"display_name":"Advanced Optical Network Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10847","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":72,"display_name":"Semiconductor Lasers and Optical Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11429","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":61,"display_name":"Advanced Fiber Laser Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T10988","score":1,"subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"}},{"count":35,"display_name":"Software-Defined Networks and 5G","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10714","score":1,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}},{"count":28,"display_name":"Advancements in PLL and VCO Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11417","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":25,"display_name":"Analog and Mixed-Signal Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10323","score":1,"subfield":{"display_name":"Biomedical Engineering","id":"https://openalex.org/subfields/2204"}},{"count":22,"display_name":"Network Security and Intrusion Detection","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10400","score":1,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}},{"count":17,"display_name":"Radio Frequency Integrated Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10187","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":17,"display_name":"Software System Performance and Reliability","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12127","score":1,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}},{"count":15,"display_name":"Advanced Fiber Optic Sensors","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10205","score":0.9997,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":12,"display_name":"Semiconductor materials and devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10472","score":0.9999,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":11,"display_name":"Advanced Malware Detection Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11241","score":0.9997,"subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"}},{"count":11,"display_name":"PAPR reduction in OFDM","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11873","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":10,"display_name":"IoT and Edge/Fog Computing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10273","score":0.9998,"subfield":{"display_name":"Computer Networks and Communications","id":"https://openalex.org/subfields/1705"}},{"count":10,"display_name":"Low-power high-performance VLSI design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10363","score":0.9997,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":10,"display_name":"Electromagnetic Compatibility and Noise Suppression","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11444","score":0.9997,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":9,"display_name":"Anomaly Detection Techniques and Applications","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11512","score":0.9996,"subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"}},{"count":9,"display_name":"3D IC and TSV technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11527","score":0.9998,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":8,"display_name":"Advanced Wireless Communication Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10125","score":0.9999,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":8,"display_name":"VLSI and Analog Circuit Testing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11032","score":0.9999,"subfield":{"display_name":"Hardware and Architecture","id":"https://openalex.org/subfields/1708"}},{"count":7,"display_name":"Advanced MIMO Systems Optimization","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10148","score":0.9997,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":7,"display_name":"Advancements in Semiconductor Devices and Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10558","score":0.9999,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}}],"type":"company","type_id":"https://openalex.org/institution-types/company","updated_date":"2026-03-30T05:59:38.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210160469/works","works_count":477}