{"associated_institutions":[{"country_code":"NL","display_name":"Philips (Netherlands)","id":"https://openalex.org/I4210122849","relationship":"parent","ror":"https://ror.org/02p2bgp27","type":"company"}],"authors_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210159858/authors","cited_by_count":37098,"collaborators_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210159858/collaborators","country_code":"BE","counts_by_year":[{"cited_by_count":1,"oa_works_count":1,"works_count":1,"year":2025},{"cited_by_count":0,"oa_works_count":0,"works_count":1,"year":2024},{"cited_by_count":67,"oa_works_count":3,"works_count":3,"year":2023},{"cited_by_count":136,"oa_works_count":3,"works_count":4,"year":2022},{"cited_by_count":78,"oa_works_count":4,"works_count":8,"year":2021},{"cited_by_count":18,"oa_works_count":1,"works_count":2,"year":2020},{"cited_by_count":31,"oa_works_count":2,"works_count":4,"year":2019},{"cited_by_count":40,"oa_works_count":1,"works_count":1,"year":2018},{"cited_by_count":282,"oa_works_count":6,"works_count":9,"year":2017},{"cited_by_count":87,"oa_works_count":2,"works_count":5,"year":2016},{"cited_by_count":56,"oa_works_count":4,"works_count":4,"year":2015},{"cited_by_count":12,"oa_works_count":1,"works_count":3,"year":2014},{"cited_by_count":17,"oa_works_count":2,"works_count":3,"year":2013},{"cited_by_count":90,"oa_works_count":1,"works_count":7,"year":2012},{"cited_by_count":139,"oa_works_count":2,"works_count":5,"year":2011},{"cited_by_count":223,"oa_works_count":0,"works_count":4,"year":2010}],"counts_by_year_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210159858/counts_by_year","created_date":"2022-02-02T04:48:36.000Z","display_name":"Philips (Belgium)","display_name_acronyms":[],"display_name_alternatives":["Philips (Belgium)","Royal Philips"],"geo":{"city":"Brussels","country":"Belgium","country_code":"BE","geonames_city_id":"2800866","latitude":50.83221435546875,"longitude":4.32810115814209,"region":null},"homepage_url":"http://www.philips.be/","id":"https://openalex.org/I4210159858","ids":{"grid":"grid.425457.5","openalex":"https://openalex.org/I4210159858","ror":"https://ror.org/05bsjqt55","wikidata":null,"wikipedia":"https://en.wikipedia.org/wiki/Philips"},"image_thumbnail_url":null,"image_url":null,"is_super_system":false,"lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210159858"],"repositories":[],"roles":[{"id":"https://openalex.org/I4210159858","role":"institution","works_count":863}],"ror":"https://ror.org/05bsjqt55","status":"active","summary_stats":{"2yr_mean_citedness":0.5,"h_index":79,"i10_index":670},"topic_share":[{"display_name":"Advancements in Semiconductor Devices and Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10558","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0008154},{"display_name":"Advancements in Photolithography Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11338","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0006011},{"display_name":"Semiconductor materials and devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10472","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0005882},{"display_name":"Integrated Circuits and Semiconductor Failure Analysis","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14117","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0005831},{"display_name":"Copper Interconnects and Reliability","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T11661","subfield":{"display_name":"Electronic, Optical and Magnetic Materials","id":"https://openalex.org/subfields/2504"},"value":0.0005659},{"display_name":"Silicon and Solar Cell Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10624","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0005597},{"display_name":"Semiconductor materials and interfaces","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11853","subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"},"value":0.0003883},{"display_name":"Ferroelectric and Negative Capacitance Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12808","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0003857},{"display_name":"Matrix Theory and Algorithms","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10792","subfield":{"display_name":"Computational Theory and Mathematics","id":"https://openalex.org/subfields/1703"},"value":0.000314},{"display_name":"Electrostatic Discharge in Electronics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12495","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0003009},{"display_name":"Digital Image Processing Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12923","subfield":{"display_name":"Computer Vision and Pattern Recognition","id":"https://openalex.org/subfields/1707"},"value":0.0002951},{"display_name":"Radio Frequency Integrated Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10187","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0002822},{"display_name":"Coding theory and cryptography","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11130","subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"},"value":0.0002761},{"display_name":"Silicon Carbide Semiconductor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10361","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0002414},{"display_name":"3D IC and TSV technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11527","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0002399},{"display_name":"Digital Filter Design and Implementation","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11034","subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"},"value":0.000235},{"display_name":"Advanced Queuing Theory Analysis","domain":{"display_name":"Social Sciences","id":"https://openalex.org/domains/2"},"field":{"display_name":"Business, Management and Accounting","id":"https://openalex.org/fields/14"},"id":"https://openalex.org/T10974","subfield":{"display_name":"Management Information Systems","id":"https://openalex.org/subfields/1404"},"value":0.000214},{"display_name":"graph theory and CDMA systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11797","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0002096},{"display_name":"VLSI and FPGA Design Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11522","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0001995},{"display_name":"Low-power high-performance VLSI design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10363","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0001903},{"display_name":"Mathematical functions and polynomials","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Mathematics","id":"https://openalex.org/fields/26"},"id":"https://openalex.org/T11191","subfield":{"display_name":"Applied Mathematics","id":"https://openalex.org/subfields/2604"},"value":0.0001883},{"display_name":"Cellular Automata and Applications","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T12162","subfield":{"display_name":"Computational Theory and Mathematics","id":"https://openalex.org/subfields/1703"},"value":0.0001858},{"display_name":"Cryptographic Implementations and Security","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10951","subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"},"value":0.0001831},{"display_name":"Silicon Nanostructures and Photoluminescence","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T11169","subfield":{"display_name":"Materials Chemistry","id":"https://openalex.org/subfields/2505"},"value":0.0001659},{"display_name":"Thin-Film Transistor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10623","subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"},"value":0.0001635}],"topics":[{"count":264,"display_name":"Semiconductor materials and devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10472","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":179,"display_name":"Advancements in Semiconductor Devices and Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10558","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":102,"display_name":"Integrated Circuits and Semiconductor Failure Analysis","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T14117","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":77,"display_name":"Silicon and Solar Cell Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10624","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":69,"display_name":"Semiconductor materials and interfaces","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Physics and Astronomy","id":"https://openalex.org/fields/31"},"id":"https://openalex.org/T11853","score":1,"subfield":{"display_name":"Atomic and Molecular Physics, and Optics","id":"https://openalex.org/subfields/3107"}},{"count":47,"display_name":"Copper Interconnects and Reliability","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T11661","score":1,"subfield":{"display_name":"Electronic, Optical and Magnetic Materials","id":"https://openalex.org/subfields/2504"}},{"count":46,"display_name":"Matrix Theory and Algorithms","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10792","score":0.9999,"subfield":{"display_name":"Computational Theory and Mathematics","id":"https://openalex.org/subfields/1703"}},{"count":41,"display_name":"Advancements in Photolithography Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11338","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":39,"display_name":"Radio Frequency Integrated Circuit Design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10187","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":36,"display_name":"Silicon Carbide Semiconductor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10361","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":32,"display_name":"Coding theory and cryptography","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11130","score":1,"subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"}},{"count":29,"display_name":"Advanced Memory and Neural Computing","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10502","score":0.9998,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":26,"display_name":"Neural Networks and Applications","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10320","score":0.9998,"subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"}},{"count":26,"display_name":"Ferroelectric and Negative Capacitance Devices","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12808","score":0.9999,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":24,"display_name":"Thin-Film Transistor Technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10623","score":0.9999,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":22,"display_name":"graph theory and CDMA systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11797","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":22,"display_name":"Electrostatic Discharge in Electronics","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T12495","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":21,"display_name":"Low-power high-performance VLSI design","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T10363","score":1,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":21,"display_name":"Electronic and Structural Properties of Oxides","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T12588","score":1,"subfield":{"display_name":"Materials Chemistry","id":"https://openalex.org/subfields/2505"}},{"count":19,"display_name":"Formal Methods in Verification","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10142","score":0.9999,"subfield":{"display_name":"Computational Theory and Mathematics","id":"https://openalex.org/subfields/1703"}},{"count":19,"display_name":"3D IC and TSV technologies","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Engineering","id":"https://openalex.org/fields/22"},"id":"https://openalex.org/T11527","score":0.9999,"subfield":{"display_name":"Electrical and Electronic Engineering","id":"https://openalex.org/subfields/2208"}},{"count":18,"display_name":"Silicon Nanostructures and Photoluminescence","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Materials Science","id":"https://openalex.org/fields/25"},"id":"https://openalex.org/T11169","score":0.9999,"subfield":{"display_name":"Materials Chemistry","id":"https://openalex.org/subfields/2505"}},{"count":18,"display_name":"Blind Source Separation Techniques","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T11447","score":0.9993,"subfield":{"display_name":"Signal Processing","id":"https://openalex.org/subfields/1711"}},{"count":17,"display_name":"Logic, programming, and type systems","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10126","score":0.9999,"subfield":{"display_name":"Artificial Intelligence","id":"https://openalex.org/subfields/1702"}},{"count":17,"display_name":"Service-Oriented Architecture and Web Services","domain":{"display_name":"Physical Sciences","id":"https://openalex.org/domains/3"},"field":{"display_name":"Computer Science","id":"https://openalex.org/fields/17"},"id":"https://openalex.org/T10679","score":0.9988,"subfield":{"display_name":"Information Systems","id":"https://openalex.org/subfields/1710"}}],"type":"company","type_id":"https://openalex.org/institution-types/company","updated_date":"2026-03-30T05:59:38.000Z","works_api_url":"https://scholar.citedevidence.com/v1/oa/institutions/I4210159858/works","works_count":863}